Posts by Aakash Umesh Mange and Jeff Zhao, Ph. D.
Sine Sweep in High Frequency Range

A typical vibration test often requires running the test up to 2000 Hz or beyond. This is a tremendous challenge because the resonant and anti-resonant frequencies are often only a few hundred Hz. This article analyzes the obstacles to running a sine test over a high frequency range, including the dynamic characteristics of the Unit Under Test (UUT) and fixtures, the control dynamic range of the vibration controllers, and the sensor mounting locations. Several strategies and recommendations are then discussed with results.

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Comparison of Multi-Resolution Spectrum Technology and Regular FFT in Modal Analysis

Modal testing and analysis are crucial processes in the product development cycle. Sometimes the testing results are wrong by several magnitudes, especially in the low frequency bands where the frequency resolution is not sufficient. Crystal Instruments’ patented Multi-Resolution (MR) Spectrum technology helps overcome this issue with a unique solution.

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